Paul Leisher | 17-ERD-069
Using experimental data as a quantitative basis, we are exploring a new framework that will improve the output power and efficiency of lasers and reduce the risk of diode failure by predicting robustness to back-irradiance from reflections. If successful, this model will be suitable for a range of device configurations and operating conditions, with applications for defense, scientific exploration, and industry.
Publications and Presentations
Boisselle, M., et al. 2018. "Reliable Operation of High Power Diode Pumps in Laser Systems with Back-Irradiance." SPIE Photonics West, Sand Francisco, CA, January, 2018. LLNL-PRES-744574.
Jha, A. K., et al. 2018. "Thermoreflectance Imaging of High Power Diode Lasers Under Back-Irradiance Conditions." IEEE International Semiconductor Laser Conference (ISLC), Santa Fe, NM, Sept. 2018. LLNL-PRES-758114.
Leisher, P. O., et al. 2018. "Effects of Back-Irradiance on the Reliability of Gas High Power Diode Pump Lasers." Advanced Lasers and Photon Sources (ALPS/OPIC), Yokohama, Japan, April 2018. LLNL-PRES-750140.
——— . 2018. "Feedback-Induced Failure of High Power Diode Lasers." IEEE Journal of Quantum Electronics. 54. 1. LLNL-JRNL-753607.
——— . 2018. "Opportunities in Semiconductor Laser Technology for Meeting the Requirements of Future High Energy Laser Missions." IEEE International Semiconductor Laser Conference (ISLC), Santa Fe, NM, Sept. 2018. LLNL-PRES-758113.
——— . 2018. "Root Cause Investigation of Back-Irradiance-Induced Failure of High Power Diode Lasers." 2017 IEEE High Power Diode Lasers & Systems (HPD) Conference, Coventry, UK, Oct. 2017. LLNL-PROC-739350.
Li, C., et al. 2018. "CCD-Based Thermoreflectance Imaging of High Power Diode Lasers with Back-Irradiance." 2018 SPIE Defense + Commercial Sensing. 10637. LLNL-PROC-747523.
——— . 2018. "Thermal Imaging of High Power Diode Lasers Subject to Back-Irradiance." Applied Physics Letters. 112. 101101. LLNL-JRNL-741541.