Characterizing Materials for Quantum Computing

Yaniv Rosen | 20-ERD-010

Executive Summary

We will design and fabricate a quantum materials sensor that can be used for materials characterization, which we will then leverage to develop a methodology to perform multiscale modeling of defects in materials used in the manufacture of quantum circuitry. This research supports advanced manufacturing of quantum computing devices.

Publications, Presentations, and Patents

“APS -APS March Meeting 2021 - Event - Finite Element Analysis of Transmission Loss across a Coplanar Waveguide-Integrated Printed Circuit Board for Quantum Information Science Applications.” n.d. In Bulletin of the American Physical Society. American Physical Society. Accessed September 20, 2021.

Molina-Ruiz, M., Y. J. Rosen, H. C. Jacks, M. R. Abernathy, T. H. Metcalf, X. Liu, J. L. DuBois, and F. Hellman. 2021. “Origin of Mechanical and Dielectric Losses from Two-Level Systems in Amorphous Silicon,” Physical Review Materials 5 (3): 035601.