High-Resolution Three-Dimensional Imaging via X-Ray Reflectometry and Phase-Contrast Computed Tomography

Kadri Aditya Mohan | 19-ERD-022

Executive Summary

We will develop a method for producing high-resolution measurements of surface topography and density variations in low-x-ray-absorptive materials by integrating two imaging techniques, x-ray reflectometry and holotomography, with reconstruction algorithms. If successful, this method will advance the field of metrology by exploiting nontraditional x-ray physics to achieve three-dimensional imaging at submicron- and nanometer-scale resolutions for applications in advanced materials and manufacturing.

Publications, Presentations, and Patents

Mohan, K. A., et al. 2020a. "Constrained Non-Linear Phase Retrieval for Single Distance X-ray Phase Contrast Tomography." IS&T International Symposium on Electronic Imaging 2020: Computational Imaging. doi:10.2352/ISSN.2470-1173.2020.14.COIMG-146. LLNL-PROC-803597

——— 2020b. "SABER: A Systems Approach to Blur Estimation and Reduction in X-Ray Imaging." IEEE Transactions on Image Processing 29, pp. 7751–7764. doi: 10.1109/TIP.2020.3006339. LLNL-JRNL-760284