Advanced Quantitative Metrology and Characterization for Manufacturing

Joseph Tringe | 20-SI-001

Executive Summary

We will enable new qualification processes for manufactured components by discovering synergistic modes of characterization appropriate for geometrically and compositionally complex structures formed by both traditional and advanced manufacturing methods. These quantitative three-dimensional characterization capabilities are driven by new model-based requirements that must replace empirically derived legacy requirements.

Publications, Presentations, and Patents

Cherepy, N., et al. 2020. "Scintillators and Detectors for MeV X-ray and Neutron Imaging." SPIE Optical Engineering + Applications Proceedings, Vol. 11494, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXII: 114940N. LLNL-PROC-814596

Oksuz, I., et al. 2020. "Characterization of a Reactor-Based Fast Neutron Beam Facility for Fast Neutron Imaging." SPIE Optical Engineering + Applications (online). doi: 10.1117/12.2569964. LLNL-PROC-814265

Townsend, A., et al. 2020. "Parametrically Designed Surface Topography on CAD Models of Additively Manufactured Lattice Structures for Improved Design Validation." Additive Manufacturing. doi: 10.1016/j.addma.2020.101731. LLNL-JRNL-812397