Leora Dresselhaus-Cooper | 18-ERD-063
Executive Summary
We are developing a new platform for probing nanoscale crystal defects embedded within materials and for imaging ultrafast structural changes in materials, such as those induced by shock waves, using dark-field x-ray microscopy. The resulting first-of-their-kind measurements will inform mechanistic models, enabling improved predictions of material properties under stress for applications in advanced materials and nuclear weapons science.
