Jaehyun Cho | 20-LW-027
Executive Summary
Leveraging recent advances in supercomputer power and algorithmic development, we will develop a multiscale modeling method for materials with interfaces at nano- and micro-length scales. This unique modeling approach will enable us to study defect pattern formation as the result of individual material defects in microstructure and to control the manufacturing process of advanced materials used across the national security mission space.
