Improving Durability in the Next Generation of Photovoltaic Materials Through Discovery and Mitigation of Interface-Based Degradation Mechanisms

Jonathan Lee | 20-ERD-060

Executive Summary

By integrating advanced computational simulations with synthesis and experimental characterization methods, we will investigate the structure and properties of interfaces in thin-film photovoltaics with the aim of identifying the phenomena and mechanisms that limit device performance and lead to degradation. This research is a key step toward the accelerated and rational design of thin-film photovoltaic architectures with improved performance and durability in support of national energy security goals.