Virtual Inspection of Advanced Manufacturing via Process-Scale Digital Twins
Brian Giera | 23-SI-003
Executive Summary
The project will accelerate inspection of advanced manufacturing components by leveraging process- and part-scale digital twins, which are rich models that enable virtual assessment of performance. The project will enhance mission agility by expediting part delivery with reduced uncertainty and linking design with performance in a manner extensible to other manufacturing approaches.
Publications, Presentations, and Patents
Francielly Rodrigues, Alexander Giovannelli, Leonardo Pavanatto, Haichao Miao, Jauvane C. de Oliveira, Doug Bowman, “AMP-IT and WISDOM: Improving 3D Manipulation for High-Precision Tasks in Virtual Reality” (Presentation, IEEE International Symposium on Mixed and Augmented Reality, Sydney, Australia, Oct 16-20, 2023).
D. J. Kline, M. D. Grapes, M. P. Hennessey, S. P. Mish, G. C. Egan, W. P. Bassett, H. K. Springer, R. V. Reeves, S. E. Watts, B. Giera, K. T. Sullivan, J. L. Belof, “Developing Digital Twins of Additively Manufactured Components” (Presentation, EuroPyro, 46th IPS Seminar, Saint Malo, France, Sept. 11-14, 2023).
Nishant Ojal, Alexander Blum, Alexander Caviness, Brian Au, Brian Giera. “Optimizing Exposure Times of Structured Light Metrology Systems Using a Digital Twin.” Measurement. (in press)
